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CDM2208-800FP

8A,800V Through-Hole MOSFET N-Channel Enhancement Mode High Current

Case Type: TO-220FP

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Technical Specifications

Similar Products with Selected Specifications
Body Diode Reverse Recovery (trr)
310 ns
Body Diode Stored Charge (Qrr)
0.53 µC
Common Source Input Capacitance (Ciss)
1110 pF
Common Source Output Capacitance (Coss)
104 pF
Common Source Reverse Transfer Capacitance (Crss)
2.7 pF
Continuous Drain Current (ID)
8 A
Continuous Source Current (Body Diode) (IS)
8 A
Diode Forward On Voltage (VSD)
1.4 V

(0.9 V Typical)

Drain-Source Breakdown Voltage (BVDSS)
800 V
Drain-Source Voltage (VDS)
800 V
Fall Time (tf)
37 ns
Gate Leakage Current, Forward (IGSSF)
100 nA

(30 nA Typical)

Gate Leakage Current, Reverse (IGSSR)
100 nA

(30 nA Typical)

Gate Threshold Voltage (VGS(th))
2 — 4 V

(2.9 V Typical)

Gate-Drain Charge (Qgd)
9.94 nC
Gate-Source Charge (Qgs)
5.76 nC
Gate-Source Voltage (VGS)
30 V
Junction Temperature (Tj)
-55 — 150 °C
Maximum Pulsed Drain Current (IDM)
32 A
Maximum Pulsed Source Current (ISM)
32 A
Power Dissipation (PD)
57 W
Rise Time (tr)
34 ns
Saturation Drain Current (IDSS)
1 µA

(0.05 µA Typical)

Single Pulse Avalanche Energy (EAS)
534 mJ
Static Drain-Source On Resistance (rDS(ON))
1.6 Ω

(1.42 Ω Typical)

Storage Temperature (Tstg)
-55 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
120 °C/W
Thermal Resistance Junction-Case (ΘJC)
2.19 °C/W
Total Gate Charge (Qg)
24.45 nC
Turn-off Delay Time (tOFF)
65 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CDM2208-800FP Sleeve@50 Discontinued 8A,800V Through-Hole MOSFET N-Channel Enhancement Mode High Current EAR99 8541.29.0095 PBFREE
CDM2208-800FP SL Sleeve@50 Discontinued 8A,800V Through-Hole MOSFET N-Channel Enhancement Mode High Current EAR99 8541.29.0095 PBFREE

Resources

Item Type
Analytical Test Report:Die Attach Analytical Test Report
Analytical Test Report:Die Attach Analytical Test Report
Analytical Test Report:Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Lead frame Analytical Test Report
Analytical Test Report:Lead frame Analytical Test Report
Analytical Test Report:Ni added Al Bond Wire Analytical Test Report
Analytical Test Report:Plating Analytical Test Report
Analytical Test Report:Pure Tin Plating Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
CDM2208-800FP.PDF Device Datasheet
Package Detail Document:TO-220FP Package Detail Document
Product EOL Notice:CDM22012-800LRFP Product EOL Notice
Spice Model:Spice Model CDM2208-800FP Spice Model

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