CPD21-CTLHR10-06
10A,600V Bare die,110.000 X 110.000 mils,Rectifier-Hyperfast <25ns
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 10 A
(1.6 V Typical)
Test Conditions
IF = 10 A
TA = 125 °C
Test Conditions
IF = 10 A
TA = -40 °C
Test Conditions
VR = 4 V
f = 1 MHz
Test Conditions
IR = 500 µA
Test Conditions
IF = 10 A
VR = 400 V
di/dt = 200 A/µs
(22 ns Typical)
Test Conditions
VR = 600 V
(1.2 µA Typical)
Test Conditions
VR = 600 V
TA = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD21-CTLHR10-06-CT | WafflePack@100 | Active | 10A,600V Bare die,110.000 X 110.000 mils,Rectifier-Hyperfast <25ns | EAR99 | 8541.10.0040 | PBFREE | |
| CPD21-CTLHR10-06-WN | Wafer | Active | 10A,600V Bare die,110.000 X 110.000 mils,Rectifier-Hyperfast <25ns | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| Package Detail Document:WAFER | Package Detail Document |
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