CPD102X-CMPD6263
70V Bare die,9.060 X 9.060 mils,Diode-Schottky (<1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 1 mA
(395 mV Typical)
Test Conditions
f = 1 MHz
Test Conditions
IR = 10 µA
Test Conditions
VR = 50 V
(10 nA Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD102X-CMPD6263-CT | WafflePack@1,024 | Not Recommended for New Design | 70V Bare die,9.060 X 9.060 mils,Diode-Schottky (<1A) | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CPD102X-CMPD6263_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CPD51V Replaces CPD102X | Process Change Notice |
| Spice Model:Spice Model CPD102X | Spice Model |