CPD104R-CFSH2-3L
200mA,30V Bare die,14.567 X 14.567 mils,Diode-Schottky (<1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 0.1 mA
(115 mV Typical)
Test Conditions
IF = 1 mA
(175 mV Typical)
Test Conditions
IF = 10 mA
(240 mV Typical)
Test Conditions
IF = 100 mA
(350 mV Typical)
Test Conditions
IF = 200 mA
(420 mV Typical)
Test Conditions
VR = 4 V
f = 1 MHz
(11 pF Typical)
Test Conditions
IR = 500 µA
Test Conditions
VR = 10 V
(4 µA Typical)
Test Conditions
VR = 30 V
(10 µA Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD104R-CFSH2-3L-CT | WafflePack@400 | Active | 200mA,30V Bare die,14.567 X 14.567 mils,Diode-Schottky (<1A) | EAR99 | 8541.10.0040 | PBFREE | |
| CPD104R-CFSH2-3L-WN | Wafer | Active | 200mA,30V Bare die,14.567 X 14.567 mils,Diode-Schottky (<1A) | EAR99 | 8541.10.0040 | PBFREE | |
| CPD104R-CFSH2-3L-WR | Wafer | Active | 200mA,30V Bare die,14.567 X 14.567 mils,Diode-Schottky (<1A) | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| Package Detail Document:WAFER | Package Detail Document |
| Spice Model:Spice Model CPD104R | Spice Model |
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