CPD85V-CMPSH1-4L

1A,40V Bare die,39.400 X 39.400 mils,Rectifier-Schottky (>=1A)

Case Type: WAFER

Average Forward Current (IO)
1 A
Forward Voltage (VF)
270 mV

(230 mV Typical)

Forward Voltage (VF)
340 mV

(300 mV Typical)

Forward Voltage (VF)
390 mV

(340 mV Typical)

Forward Voltage (VF)
420 mV

(390 mV Typical)

Junction Capacitance (CJ)
50 pF
Junction Temperature (Tj)
-65 — 125 °C
Peak Forward Surge Current (IFSM)
20 A
Peak Repetitive Reverse Voltage (VRRM)
40 V
Power Dissipation (PD)
350 mW
Reverse Breakdown Voltage (BVR)
40 V
Reverse Voltage Leakage Current (IR)
900 µA

(150 µA Typical)

Reverse Voltage Leakage Current (IR)
1.5 mA

(0.25 mA Typical)

Storage Temperature (Tstg)
-65 — 125 °C
Thermal Resistance Junction-Ambient (ΘJA)
286 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CPD85V-CMPSH1-4L-WN Wafer Active 1A,40V Bare die,39.400 X 39.400 mils,Rectifier-Schottky (>=1A) EAR99 8541.10.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CPD85V-CMPSH1-4L_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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