CPD85V-CMPSH1-4L
1A,40V Bare die,39.400 X 39.400 mils,Rectifier-Schottky (>=1A)
Case Type: WAFER
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 100 mA
(230 mV Typical)
Test Conditions
IF = 500 mA
(300 mV Typical)
Test Conditions
IF = 1 A
(340 mV Typical)
Test Conditions
IF = 1.5 A
(390 mV Typical)
Test Conditions
VR = 10 V
f = 1 MHz
Test Conditions
IR = 1 mA
Test Conditions
VR = 20 V
(150 µA Typical)
Test Conditions
VR = 30 V
(0.25 mA Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD85V-CMPSH1-4L-WN | Wafer | Active | 1A,40V Bare die,39.400 X 39.400 mils,Rectifier-Schottky (>=1A) | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPD85V-CMPSH1-4L_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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