CPD41-1N4150
200mA,50V Bare die,19.685 X 19.685 mils,Diode-Switching
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
if = 200 mA
vfr = 1 V
tr = 0.4 ns
Test Conditions
IF = 1 mA
Test Conditions
IF = 10 mA
Test Conditions
IF = 50 mA
Test Conditions
IF = 100 mA
Test Conditions
IF = 200 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 5 µA
Test Conditions
IF = 10 mA
IR = 10 mA
RL = 100 Ω
Test Conditions
IF = 200 mA
IR = 200 mA
RL = 100 Ω
Test Conditions
IF = 400 mA
IR = 400 mA
RL = 100 Ω
Test Conditions
VR = 50 V
Test Conditions
VR = 50 V
TA = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD41-1N4150-CT | WafflePack@400 | Discontinued | 200mA,50V Bare die,19.685 X 19.685 mils,Diode-Switching | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CPD41.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CPD41 REPLACED WITH CPD93V | Process Change Notice |
| Product EOL Notice:BLANKET PDN-BARE DIE PRODUCTS | Product EOL Notice |
Product Support
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Design Support
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- Free quick ship samples (2nd day air)
- Online technical data and parametric search
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- Environmental regulation compliance
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- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development