CPD80V-CMPD2004
200mA,300V Bare die,16.100 X 16.100 mils,Diode-Switching
Case Type: WAFER
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 100 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 100 µA
Test Conditions
IF = 30 mA
IR = 30 mA
RL = 100 Ω
Irr = 3 mA
Test Conditions
VR = 240 V
Test Conditions
VR = 240 V
TA = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD80V-CMPD2004-WN | Wafer | Active | 200mA,300V Bare die,16.100 X 16.100 mils,Diode-Switching | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPD80V-CMPD2004_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:Wafer Diameter Change from 4" | Process Change Notice |
| Spice Model:Spice Model CPD80V | Spice Model |
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Design Support
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- Package details
- Application notes
- Application and design sample kits
- Custom product and package development