CPD83V-1N914A
Bare die,11.027 X 11.027 mils,High Speed Switching Diode
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 10 mA
(720 mV Typical)
Test Conditions
IF = 100 mA
(915 mV Typical)
Test Conditions
f = 1 MHz
Test Conditions
IR = 100 µA
(150 V Typical)
Test Conditions
IF = 10 mA
IR = 10 mA
RL = 100 Ω
Irr = 1 mA
Test Conditions
VR = 20 V
Test Conditions
VR = 75 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD83V-1N914A-CM | WafflePack@400 | Active | Bare die,11.027 X 11.027 mils,High Speed Switching Diode | EAR99 | 8541.10.0040 | PBFREE | |
| CPD83V-1N914A-CT | WafflePack@400 | Active | Bare die,11.027 X 11.027 mils,High Speed Switching Diode | EAR99 | 8541.10.0040 | PBFREE | |
| CPD83V-1N914A-WN | Wafer | Active | Bare die,11.027 X 11.027 mils,High Speed Switching Diode | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPD83V-1N914A_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:Wafer Diameter Change from 4" | Process Change Notice |
| Spice Model:Spice Model CPD83V | Spice Model |
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Design Support
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