CPD91V-CMPD6001

100V Bare die,11.030 X 11.030 mils,Diode-Ultra Low Leakage

Case Type: CHIP,WAFFLE

Continuous Forward Current (IF)
250 mA
Continuous Reverse Voltage (VR)
75 V
Forward Voltage (VF)
850 mV
Forward Voltage (VF)
950 mV
Forward Voltage (VF)
1.1 V
Junction Capacitance (CJ)
2 pF
Junction Temperature (Tj)
-65 — 150 °C
Peak Forward Surge Current (IFSM)
4 A
Peak Forward Surge Current (IFSM)
1 A
Peak Repetitive Forward Current (IFRM)
250 mA
Peak Repetitive Reverse Voltage (VRRM)
100 V
Power Dissipation (PD)
350 mW
Reverse Breakdown Voltage (BVR)
100 V
Reverse Recovery Time (trr)
3 µs
Reverse Voltage Leakage Current (IR)
500 pA
Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
357 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CPD91V-CMPD6001-CM WafflePack@400 Active 100V Bare die,11.030 X 11.030 mils,Diode-Ultra Low Leakage EAR99 8541.10.0040 PBFREE
CPD91V-CMPD6001-CT WafflePack@400 Active 100V Bare die,11.030 X 11.030 mils,Diode-Ultra Low Leakage EAR99 8541.10.0040 PBFREE

Resources

Analytical Test Report:Alloy 42 leadframe Analytical Test Report
Analytical Test Report:Copper Bond Wire Analytical Test Report
Analytical Test Report:Gold Bond Wire Analytical Test Report
Analytical Test Report:Gold Bond Wire Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Halogen Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Leadframe Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
CPD91V-CMPD6001_WPD.PDF Device Datasheet
Material Composition:SOD-523 Material Composition
Package Detail Document:SOD-523 Package Detail Document
Process Change Notice:Copper Wire Bonding - SOD-523 Process Change Notice
Product Reliability Data:SOD-523 Package Reliability Product Reliability Data
Spice Model:I-Spice Model CMOD6001 Spice Model
Spice Model:P-Spice Model CMOD6001 Spice Model