CPD93V-1N3600
Bare die,12.795 X 12.795 mils,Diode-Switching,0.25A, 50V Switching Diode
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
if = 200 mA
vfr = 1 V
tr = 0.4 ns
Test Conditions
IF = 1 mA
Test Conditions
IF = 10 mA
Test Conditions
IF = 50 mA
Test Conditions
IF = 100 mA
Test Conditions
IF = 200 mA
Test Conditions
f = 1 MHz
Test Conditions
IR = 5 µA
Test Conditions
IF = 10 mA
IR = 10 mA
RL = 100 Ω
Test Conditions
IF = 200 mA
IR = 200 mA
RL = 100 Ω
Test Conditions
IF = 400 mA
IR = 400 mA
RL = 100 Ω
Test Conditions
VR = 50 V
Test Conditions
VR = 50 V
TA = 150 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPD93V-1N3600-CT | WafflePack@400 | Discontinued | Bare die,12.795 X 12.795 mils,Diode-Switching,0.25A, 50V Switching Diode | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPD93V-1N3600_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CPD93V-1N4150 | Product EOL Notice |
| Spice Model:Spice Model CPD93 | Spice Model |