CPZ58X-1N4103
9.1V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 200 mA
Test Conditions
IZT = 250 µA
Test Conditions
VR = 7 V
Test Conditions
IZT = 250 µA
Test Conditions
IZT = 250 µA
(9.1 V Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPZ58X-1N4103-CT | WafflePack@400 | Active | 9.1V,250mW Bare die,12.990 X 12.990 mils,Diode-Zener | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CPZ28X-1N4099-4135_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |