CPZ58X-1N759A
12V,500mW Bare die,12.990 X 12.990 mils,Diode-Zener
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IF = 200 mA
Test Conditions
VR = 1 V
Test Conditions
VR = 1 V
TA = 150 °C
Test Conditions
IZT = 20 mA
Test Conditions
IZT = 20 mA
(12 V Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPZ58X-1N759A-CT | WafflePack@400 | Active | 12V,500mW Bare die,12.990 X 12.990 mils,Diode-Zener | EAR99 | 8541.10.0040 | PBFREE | |
| CPZ58X-1N759A-WN | Wafer | Active | 12V,500mW Bare die,12.990 X 12.990 mils,Diode-Zener | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPZ28X-1N746A-759A_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
Product Support
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Design Support
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