CP226V-2N4391
4V,10V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 20 V
f = 1 MHz
Test Conditions
VGS = 12 V
f = 1 MHz
Test Conditions
VDS = 20 V
VGS = 12 V
Test Conditions
VDS = 20 V
VGS = 12 V
TA = 150 °C
Test Conditions
f = 1 kHz
Test Conditions
ID = 12 mA
Test Conditions
VGS(off) = 12 V
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
TA = 125 °C
Test Conditions
IG = 1 µA
Test Conditions
VDS = 20 V
ID = 1 nA
Test Conditions
IG = 1 mA
Test Conditions
ID(on) = 12 mA
Test Conditions
VDS = 20 V
Test Conditions
ID = 1 mA
Test Conditions
VGS(off) = 12 V
Test Conditions
ID(on) = 12 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP226V-2N4391-CM | WafflePack@400 | Active | 4V,10V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | EAR99 | 8541.29.0040 | PBFREE | |
| CP226V-2N4391-CT | WafflePack@400 | Active | 4V,10V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | EAR99 | 8541.29.0040 | PBFREE | |
| CP226V-2N4391-CT20 | WafflePack@20 | Active | 4V,10V,50mA,1.8W Bare die,20.000 X 17.000 mils,JFET | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP226V-2N4391_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |