CP232V-2N4416A

2.5V,6V,10mA,300mW Bare die,14.000 X 14.000 mils,JFET

Case Type: CHIP,WAFFLE

Common Source Input Capacitance (Ciss)
4 pF
Common Source Input Susceptance (biss)
2.5 mS
Common Source Input Susceptance (biss)
10 mS
Common Source Output Capacitance (Coss)
2 pF
Common Source Output Susceptance (boss)
1000 µS
Common Source Output Susceptance (boss)
4000 µS
Common Source Power Gain (GPS)
18 dB
Common Source Power Gain (GPS)
10 dB
Common Source Reverse Transfer Capacitance (Crss)
1 pF
Continuous Gate Current (IG)
10 mA
Drain-Gate Voltage (VDG)
35 V
Drain-Source Voltage (VDS)
35 V
Forward Transadmittance (gfs)
4500 — 7500 µS
Forward Transadmittance (gfs)
4000 µS
Gate Leakage Current (IGSS)
100 pA
Gate Leakage Current (IGSS)
100 nA
Gate-Source Breakdown Voltage (BVGSS)
35 V
Gate-Source Cutoff Voltage (VGS(OFF))
2.5 — 6 V
Gate-Source Voltage (VGS)
35 V
Input Conductance (gis)
100 µS
Input Conductance (gis)
1000 µS
Junction Temperature (Tj)
-65 — 200 °C
Noise Figure (NF)
2 dB
Noise Figure (NF)
4 dB
Output Conductance (gos)
50 µS
Output Conductance (gos)
75 µS
Output Conductance (gos)
100 µS
Power Dissipation (PD)
300 mW
Saturation Drain Current (IDSS)
5 — 15 mA
Storage Temperature (Tstg)
-65 — 200 °C

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP232V-2N4416A-CM WafflePack@400 Active 2.5V,6V,10mA,300mW Bare die,14.000 X 14.000 mils,JFET EAR99 8541.21.0040 PBFREE
CP232V-2N4416A-CT WafflePack@400 Active 2.5V,6V,10mA,300mW Bare die,14.000 X 14.000 mils,JFET EAR99 8541.21.0040 PBFREE
CP232V-2N4416A-CT20 WafflePack@20 Special Order Item 2.5V,6V,10mA,300mW Bare die,14.000 X 14.000 mils,JFET EAR99 8541.21.0040 PBFREE
CP232V-2N4416A-WN Wafer Active 2.5V,6V,10mA,300mW Bare die,14.000 X 14.000 mils,JFET EAR99 8541.21.0040 PBFREE

Resources

Analytical Test Report:Copper Bond Wire Analytical Test Report
Analytical Test Report:Gold Bond Wire Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Green Epoxy Molding Compound Analytical Test Report
Analytical Test Report:Henkel 84-1LMISR4 Analytical Test Report
Analytical Test Report:Leadframe Analytical Test Report
Analytical Test Report:Sn Plating Analytical Test Report
CP232V-2N4416A_WPD.PDF Device Datasheet
Material Composition:SOT-23 Material Composition
Package Detail Document:SOT-23 Package Detail Document
Process Change Notice:Copper Wire Bonding Process Change Notice
Process Change Notice:CP210->CP232V Process Change Notice
Product Brief:PB JFETs Product Brief
Product Reliability Data:SOT-23 Package Reliability Product Reliability Data
Spice Model:Spice Model CMPF4416A Spice Model
Step File 3D Object:SOT-23 Step File 3D Object

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