CP232V-2N5486
2V,6V,10mA,310mW Bare die,14.000 X 14.000 mils,JFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 15 V
f = 400 MHz
Test Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VDS = 15 V
f = 400 MHz
Test Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VDS = 15 V
f = 400 MHz
Test Conditions
VDS = 15 V
ID = 4 mA
f = 100 MHz
Test Conditions
VDS = 15 V
ID = 4 mA
f = 400 MHz
Test Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VDS = 15 V
f = 1 kHz
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
TA = 100 °C
Test Conditions
IG = 1 µA
Test Conditions
VDS = 15 V
ID = 10 nA
Test Conditions
VDS = 15 V
f = 1 kHz
RG = 1 MΩ
Test Conditions
VDS = 15 V
f = 100 MHz
RG = 1 kΩ
ID = 4 mA
Test Conditions
VDS = 15 V
f = 400 MHz
RG = 1 kΩ
ID = 4 mA
Test Conditions
VDS = 15 V
f = 1 kHz
Test Conditions
VDS = 15 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP232V-2N5486-CT | WafflePack@400 | Active | 2V,6V,10mA,310mW Bare die,14.000 X 14.000 mils,JFET | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP232V-2N5486_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |