CP548-2N5116
1V,4V,50mA,500mW Bare die,21.000 X 21.000 mils,JFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VGS = 5 V
f = 1 MHz
Test Conditions
VDS = 15 V
VGS = 5 V
Test Conditions
VDS = 15 V
VGS = 5 V
TA = 150 °C
Test Conditions
f = 1 kHz
Test Conditions
ID = 3 mA
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
TA = 150 °C
Test Conditions
IG = 1 µA
Test Conditions
VDS = 15 V
ID = 1 nA
Test Conditions
IG = 1 mA
Test Conditions
VDS = 15 V
Test Conditions
ID = 1 mA
Test Conditions
VGS(off) = 5 V
VDD = 6 V
RL = 1.8 kΩ
ID = 3 mA
Test Conditions
ID(on) = 3 mA
VDD = 6 V
RL = 1.8 kΩ
VGS(ON) = 5 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP548-2N5116-CT | WafflePack@400 | Discontinued | 1V,4V,50mA,500mW Bare die,21.000 X 21.000 mils,JFET | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP548-2N5116_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP548-2N5116 | Product EOL Notice |