CP326X-CMLDM7120
1A,20V Bare die,33.500 X 25.600 mils,MOSFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 10 V
f = 1 MHz
Test Conditions
VDS = 10 V
f = 1 MHz
Test Conditions
VDS = 10 V
f = 1 MHz
Test Conditions
IS = 1 A
Test Conditions
ID = 250 µA
Test Conditions
VDS = 10 V
ID = 500 mA
Test Conditions
VGS = 8 V
Test Conditions
VGS = 8 V
Test Conditions
ID = 1 mA
VDS = 10 V
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDS = 20 V
Test Conditions
VGS = 4.5 V
ID = 500 mA
(75 mΩ Typical)
Test Conditions
VGS = 2.5 V
ID = 500 mA
(100 mΩ Typical)
Test Conditions
VGS = 1.5 V
ID = 100 mA
(200 mΩ Typical)
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDD = 10 V
ID = 500 mA
VGS = 5 V
Test Conditions
VDD = 10 V
ID = 500 mA
VGS = 5 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP326X-CMLDM7120-CT | WafflePack@400 | Active | 1A,20V Bare die,33.500 X 25.600 mils,MOSFET | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP326X-CMLDM7120_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |