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CP379X-7002AHC

Bare die,31.700 X 31.700 mils,N-Chan Enhancement Mode MOSFET

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Common Source Input Capacitance (Ciss)
240 pF
Common Source Output Capacitance (Coss)
50 pF
Common Source Reverse Transfer Capacitance (Crss)
25 pF
Continuous Drain Current (ID)
1 A
Diode Forward On Voltage (VSD)
900 mV
Drain-Gate Voltage (VDG)
60 V
Drain-Source Breakdown Voltage (BVDSS)
63 V
Drain-Source Voltage (VDS)
60 V
Gate Leakage Current, Forward (IGSSF)
10 µA
Gate Leakage Current, Reverse (IGSSR)
10 µA
Gate Threshold Voltage (VGS(th))
1.2 — 2.3 V
Gate-Drain Charge (Qgd)
0.7 nC
Gate-Source Charge (Qgs)
1 nC
Gate-Source Voltage (VGS)
20 V
Junction Temperature (Tj)
-65 — 150 °C
Maximum Pulsed Drain Current (IDM)
5 A
Power Dissipation (PD)
350 mW
Saturation Drain Current (IDSS)
500 nA
Static Drain-Source On Resistance (rDS(ON))
220 mΩ

(150 mΩ Typical)

Static Drain-Source On Resistance (rDS(ON))
300 mΩ

(200 mΩ Typical)

Storage Temperature (Tstg)
-65 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
357 °C/W
Total Gate Charge (Qg)
2.3 nC
Turn Off Time (toff)
50 ns
Turn On Time (ton)
35 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP379X-7002AHC-CT WafflePack@400 Active Bare die,31.700 X 31.700 mils,N-Chan Enhancement Mode MOSFET EAR99 8541.21.0040 PBFREE
CP379X-7002AHC-WN Wafer Active Bare die,31.700 X 31.700 mils,N-Chan Enhancement Mode MOSFET EAR99 8541.21.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP379X-7002AHC_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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