CP390-CDM4-600LR
4A,600V Bare die,117.000 X 87.400 mils,MOSFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IS = 5 A
di/dt = 100 A/µs
Test Conditions
IS = 5 A
di/dt = 100 A/µs
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
VDS = 100 V
f = 1 MHz
Test Conditions
IS = 5 A
(0.86 V Typical)
Test Conditions
ID = 250 µA
Test Conditions
ID(on) = 5 A
VDD = 300 V
RG = 25 Ω
VGS = 10 V
Test Conditions
VGS = 30 V
Test Conditions
VGS = 30 V
Test Conditions
ID = 250 µA
(3.25 V Typical)
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 5 A
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 5 A
Test Conditions
ID(on) = 5 A
VDD = 300 V
RG = 25 Ω
VGS = 10 V
Test Conditions
VDS = 600 V
(0.065 µA Typical)
Test Conditions
VGS = 10 V
ID = 2.5 A
(0.77 Ω Typical)
Test Conditions
VDS = 480 V
VGS = 10 V
ID = 5 A
Test Conditions
VDD = 300 V
ID(on) = 5 A
RG = 25 Ω
VGS = 10 V
Test Conditions
VDD = 300 V
VGS(ON) = 10 V
ID(on) = 5 A
RL = 25 Ω
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP390-CDM4-600LR-CT | WafflePack@100 | Discontinued, Stock Only | 4A,600V Bare die,117.000 X 87.400 mils,MOSFET | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP390-CDM4-600LR_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP401 replaces CP390 | Process Change Notice |
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