Home / Products / Die Solutions / MOSFETs/JFETs / MOSFETs / CP394R-CEDM7004

CP394R-CEDM7004

1.78A,30V Bare die,15.700 X 15.700 mils,MOSFET

Case Type: CHIP,WAFFLE

Back to Top Specifications Ordering Resources Support

Technical Specifications

Similar Products with Selected Specifications
Common Source Input Capacitance (Ciss)
43 pF
Common Source Output Capacitance (Coss)
8 pF
Common Source Reverse Transfer Capacitance (Crss)
5 pF
Continuous Drain Current (ID)
1.78 A
Continuous Source Current (Body Diode) (IS)
1.78 A
Diode Forward On Voltage (VSD)
0.5 — 1.1 V
Drain-Source Breakdown Voltage (BVDSS)
30 V
Drain-Source Voltage (VDS)
30 V
Forward Transconductance (gFS)
200 mS
Gate Leakage Current, Forward (IGSSF)
3 µA
Gate Leakage Current, Reverse (IGSSR)
3 µA
Gate Threshold Voltage (VGS(th))
0.5 — 1 V
Gate-Drain Charge (Qgd)
0.23 nC
Gate-Source Charge (Qgs)
0.15 nC
Gate-Source Voltage (VGS)
8 V
Junction Temperature (Tj)
-65 — 150 °C
Maximum Pulsed Drain Current (IDM)
3.56 A
Maximum Pulsed Source Current (ISM)
3.56 A
Power Dissipation (PD)
100 mW
Saturation Drain Current (IDSS)
1 µA
Static Drain-Source On Resistance (rDS(ON))
460 mΩ

(280 mΩ Typical)

Static Drain-Source On Resistance (rDS(ON))
560 mΩ

(390 mΩ Typical)

Static Drain-Source On Resistance (rDS(ON))
730 mΩ

(550 mΩ Typical)

Storage Temperature (Tstg)
-65 — 150 °C
Total Gate Charge (Qg)
0.792 nC
Turn Off Time (toff)
75 ns
Turn On Time (ton)
20 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP394R-CEDM7004-CT WafflePack@400 Active 1.78A,30V Bare die,15.700 X 15.700 mils,MOSFET EAR99 8541.21.0040 PBFREE
CP394R-CEDM7004-WN Wafer Active 1.78A,30V Bare die,15.700 X 15.700 mils,MOSFET EAR99 8541.21.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP394R.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

Product Support

Contact Product Support

AEM stands ready to assist with your latest design endeavors as your trusted partner.

  • Supply management (Customer portals)
  • Inventory bonding
  • Consolidated shipping options
  • Custom bar coding for shipments
  • Custom product packing

Design Support

Contact Design Support

AEM stands ready to assist with your latest design endeavors as your trusted partner.

  • Free quick ship samples (2nd day air)
  • Online technical data and parametric search
  • SPICE models
  • Custom electrical curves
  • Environmental regulation compliance
  • Customer specific screening
  • Up-screening capabilities
  • Special wafer diffusions
  • PbSn plating options
  • Package details
  • Application notes
  • Application and design sample kits
  • Custom product and package development