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CP405-CZDM0408N

Bare die,45.700 X 31.900 mils,N-Chan Enhancement Mode MOSFET

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Common Source Input Capacitance (Ciss)
730 pF
Common Source Output Capacitance (Coss)
58 pF
Common Source Reverse Transfer Capacitance (Crss)
64 pF
Continuous Drain Current (ID)
6 A
Diode Forward On Voltage (VSD)
1 V
Drain-Source Breakdown Voltage (BVDSS)
40 V
Drain-Source Voltage (VDS)
40 V
Gate Leakage Current, Forward (IGSSF)
100 nA
Gate Leakage Current, Reverse (IGSSR)
100 nA
Gate Threshold Voltage (VGS(th))
1 — 3 V

(1.7 V Typical)

Gate-Drain Charge (Qgd)
2.2 nC
Gate-Source Charge (Qgs)
2 nC
Gate-Source Voltage (VGS)
20 V
Junction Temperature (Tj)
-55 — 150 °C
Maximum Pulsed Drain Current (IDM)
20 A
Power Dissipation (PD)
1.2 W
Saturation Drain Current (IDSS)
1 µA
Static Drain-Source On Resistance (rDS(ON))
31 mΩ

(20 mΩ Typical)

Static Drain-Source On Resistance (rDS(ON))
45 mΩ

(30 mΩ Typical)

Storage Temperature (Tstg)
-55 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
104 °C/W
Total Gate Charge (Qg)
12 nC
Turn Off Time (toff)
33 ns
Turn On Time (ton)
27 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP405-CZDM0408N-CT WafflePack@400 Active Bare die,45.700 X 31.900 mils,N-Chan Enhancement Mode MOSFET EAR99 8541.29.0040 PBFREE
CP405-CZDM0408N-WN Wafer Active Bare die,45.700 X 31.900 mils,N-Chan Enhancement Mode MOSFET EAR99 8541.29.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP405-CZDM0408N_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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