CP406-CWDM3011N
11A,30V Bare die,63.800 X 38.900 mils,MOSFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
VDS = 15 V
f = 1 MHz
Test Conditions
IS = 2.6 A
Test Conditions
ID = 250 µA
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
Test Conditions
ID = 250 µA
(1.8 V Typical)
Test Conditions
VDS = 15 V
VGS = 5 V
ID = 10 A
Test Conditions
VDS = 15 V
VGS = 5 V
ID = 10 A
Test Conditions
VDS = 30 V
Test Conditions
VGS = 10 V
ID = 11 A
(14 mΩ Typical)
Test Conditions
VGS = 4.5 V
ID = 9 A
(18 mΩ Typical)
Test Conditions
VDS = 15 V
VGS = 5 V
ID = 10 A
Test Conditions
VDD = 15 V
VGS = 10 V
ID = 10 A
RG = 0.3 Ω
Test Conditions
VDD = 15 V
VGS = 10 V
ID = 10 A
RG = 0.3 Ω
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP406-CWDM3011N-CT | WafflePack@340 | Special Order Item | 11A,30V Bare die,63.800 X 38.900 mils,MOSFET | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP406-CWDM3011N_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |