Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 16 V
f = 1 MHz
Test Conditions
VDS = 16 V
f = 1 MHz
Test Conditions
VDS = 16 V
f = 1 MHz
Test Conditions
IS = 350 mA
Test Conditions
ID = 250 µA
Test Conditions
VGS = 4.5 V
Test Conditions
VGS = 4.5 V
Test Conditions
ID = 250 µA
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 200 mA
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 200 mA
Test Conditions
VDS = 16 V
Test Conditions
VGS = 4.5 V
ID = 430 mA
Test Conditions
VGS = 2.5 V
ID = 300 mA
Test Conditions
VGS = 1.8 V
ID = 150 mA
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 200 mA
Test Conditions
VDD = 10 V
ID = 215 mA
RG = 10 Ω
VGS = 4.5 V
Test Conditions
VDD = 10 V
RG = 10 Ω
ID = 215 mA
VGS = 4.5 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP757X-CMLDM5757-WN | Wafer | Active | 430mA,20V Bare die,22.000 X 17.000 mils,MOSFET | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP757X-CMLDM5757_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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