Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 25 V
f = 1 MHz
Test Conditions
VDS = 25 V
f = 1 MHz
Test Conditions
VDS = 25 V
f = 1 MHz
Test Conditions
IS = 2 A
Test Conditions
ID = 250 µA
Test Conditions
VDD = 20 V
VGS = 10 V
ID = 1 A
RG = 3.3 Ω
RL = 20 Ω
Test Conditions
VGS = 20 V
Test Conditions
VGS = 20 V
Test Conditions
ID = 250 µA
(2 V Typical)
Test Conditions
VDS = 32 V
VGS = 4.5 V
ID = 6 A
Test Conditions
VDS = 32 V
VGS = 4.5 V
ID = 6 A
Test Conditions
VDD = 20 V
VGS = 10 V
ID = 1 A
RG = 3.3 Ω
RL = 20 Ω
Test Conditions
VDS = 40 V
Test Conditions
VGS = 10 V
ID = 6 A
(48 mΩ Typical)
Test Conditions
VGS = 4.5 V
ID = 4 A
(80 mΩ Typical)
Test Conditions
VDS = 32 V
VGS = 4.5 V
ID = 6 A
Test Conditions
VDD = 20 V
ID = 1 A
RG = 3.3 Ω
RL = 20 Ω
VGS = 10 V
Test Conditions
VDD = 20 V
RL = 20 Ω
RG = 3.3 Ω
ID = 1 A
VGS = 10 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP771-CXDM4060P-CT | WafflePack@400 | Discontinued | 6A,40V Bare die,32.000 X 55.000 mils,MOSFET | EAR99 | 8541.29.0040 | PBFREE | |
| CP771-CXDM4060P-WN | Wafer | Discontinued | 6A,40V Bare die,32.000 X 55.000 mils,MOSFET | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP771-CXDM4060P_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP771->CP805 | Process Change Notice |
| Product EOL Notice:CP805 REPLACED CP771 | Product EOL Notice |
| Spice Model:Spice Model CP771 | Spice Model |
Product Support
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Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
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- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development