CP794R-CEDM8004
450mA,30V Bare die,15.700 X 15.700 mils,MOSFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 25 V
f = 1 MHz
(45 pF Typical)
Test Conditions
VDS = 25 V
f = 1 MHz
(8.5 pF Typical)
Test Conditions
VDS = 25 V
f = 1 MHz
(8.9 pF Typical)
Test Conditions
IS = 100 mA
Test Conditions
ID = 100 µA
Test Conditions
VDS = 10 V
ID = 100 mA
Test Conditions
VGS = 8 V
Test Conditions
VGS = 8 V
Test Conditions
ID = 250 µA
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDS = 4 V
VGS = 4 V
Test Conditions
VDS = 30 V
Test Conditions
VDS = 30 V
Test Conditions
ID = 430 mA
VGS = 4.5 V
(1 Ω Typical)
Test Conditions
ID = 200 mA
VGS = 2.5 V
(1.6 Ω Typical)
Test Conditions
ID = 100 mA
VGS = 1.8 V
(2.6 Ω Typical)
Test Conditions
VDS = 10 V
VGS = 4.5 V
ID = 1 A
Test Conditions
VDD = 15 V
RG = 1 kΩ
RL = 50 Ω
VGS = 4 V
Test Conditions
VDD = 15 V
RG = 1 kΩ
RL = 50 Ω
VGS = 4 V
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP794R-CEDM8004-CT | WafflePack@400 | Active | 450mA,30V Bare die,15.700 X 15.700 mils,MOSFET | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP794R-CEDM8004_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |