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CP802-CWDM3011P

11A,30V Bare die,85.830 X 59.450 mils,MOSFET

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Common Source Input Capacitance (Ciss)
3100 pF
Common Source Output Capacitance (Coss)
320 pF
Common Source Reverse Transfer Capacitance (Crss)
450 pF
Continuous Drain Current (ID)
11 A
Diode Forward On Voltage (VSD)
1.3 V
Drain-Source Breakdown Voltage (BVDSS)
30 V
Drain-Source Voltage (VDS)
30 V
Gate Leakage Current, Forward (IGSSF)
100 nA
Gate Leakage Current, Reverse (IGSSR)
100 nA
Gate Threshold Voltage (VGS(th))
1 — 3 V

(1.4 V Typical)

Gate-Drain Charge (Qgd)
10.1 nC
Gate-Source Charge (Qgs)
7 nC
Gate-Source Voltage (VGS)
20 V
Junction Temperature (Tj)
-55 — 150 °C
Maximum Pulsed Drain Current (IDM)
50 A
Power Dissipation (PD)
2.5 W
Saturation Drain Current (IDSS)
1 µA
Static Drain-Source On Resistance (rDS(ON))
20 mΩ

(12 mΩ Typical)

Static Drain-Source On Resistance (rDS(ON))
30 mΩ

(15 mΩ Typical)

Storage Temperature (Tstg)
-55 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
50 °C/W
Total Gate Charge (Qg)
80 nC
Turn Off Time (toff)
330 ns
Turn On Time (ton)
49 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP802-CWDM3011P-CM WafflePack@100 Special Order Item 11A,30V Bare die,85.830 X 59.450 mils,MOSFET EAR99 8541.29.0040 PBFREE
CP802-CWDM3011P-CT WafflePack@100 Special Order Item 11A,30V Bare die,85.830 X 59.450 mils,MOSFET EAR99 8541.29.0040 PBFREE
CP802-CWDM3011P-WN Wafer Special Order Item 11A,30V Bare die,85.830 X 59.450 mils,MOSFET EAR99 8541.29.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP802-CWDM3011P_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Process Change Notice:P-Channel MOSFET Wafers Process Change Notice

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