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CPG003-CDFG6511N

11.5A,650V Bare die,132.000 X 55.000 mils,MOSFET

Case Type: WAFER

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Technical Specifications

Similar Products with Selected Specifications
Common Source Input Capacitance (Ciss)
96 pF
Common Source Output Capacitance (Coss)
30 pF
Common Source Reverse Transfer Capacitance (Crss)
0.5 pF
Continuous Drain Current (ID)
11.5 A
Diode Forward On Voltage (VSD)
2.6 V
Drain-Source Breakdown Voltage (BVDSS)
650 V
Drain-Source Voltage (VDS)
650 V
Effective Output Capacitance, Energy Related (Coss(er))
43 pF
Effective Output Capacitance, Time Related (Coss(tr))
60 pF
Fall Time (tf)
4 ns
Gate Leakage Current, Forward (IGSSF)
60 µA
Gate Leakage Current, Reverse (IGSSR)
60 µA
Gate Threshold Voltage (VGS(th))
1.2 — 2.5 V

(1.7 V Typical)

Gate-Drain Charge (Qgd)
1.1 nC
Gate-Source Charge (Qgs)
0.25 nC
Gate-Source Voltage (VGS)
-1.4 — 7 V
Junction Temperature (Tj)
-55 — 150 °C
Maximum Pulsed Drain Current (IDM)
20.5 A
Power Dissipation (PD)
1.1 W
Power Dissipation (PD)
84 W
Rise Time (tr)
4 ns
Saturation Drain Current (IDSS)
20 µA

(0.45 µA Typical)

Static Drain-Source On Resistance (rDS(ON))
190 mΩ

(138 mΩ Typical)

Storage Temperature (Tstg)
-55 — 150 °C
Total Gate Charge (Qg)
2.8 nC
Turn-off Delay Time (tOFF)
1.7 ns
Turn-on Delay Time (tON)
1.4 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CPG003-CDFG6511N-WN Wafer Active 11.5A,650V Bare die,132.000 X 55.000 mils,MOSFET EAR99 8541.29.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
Package Detail Document:WAFER Package Detail Document
Product Brief:PB GANFETS Product Brief

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