CPG004-CDFG6517N
17A,650V Bare die,165.000 X 65.000 mils,MOSFET
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VDS = 400 V
f = 100 kHz
Test Conditions
VDS = 400 V
f = 100 kHz
Test Conditions
VDS = 400 V
f = 100 kHz
Test Conditions
IS = 5 A
Test Conditions
ID = 250 µA
Test Conditions
VDS = 400 V
Test Conditions
VDS = 400 V
Test Conditions
VDS = 400 V
VGS = 6 V
ID = 10 A
L = 318 µH
RG = 10 Ω
Test Conditions
VGS = 6 V
Test Conditions
VGS = 1 V
Test Conditions
ID = 17.2 mA
VGS = 650 V
(1.7 V Typical)
Test Conditions
VGS = 6 V
ID = 5 A
VDS = 400 V
Test Conditions
VGS = 6 V
ID = 5 A
VDS = 400 V
Test Conditions
VDS = 400 V
VGS = 6 V
ID = 10 A
L = 318 µH
RG = 10 Ω
Test Conditions
VDS = 650 V
(0.6 µA Typical)
Test Conditions
VGS = 6 V
ID = 5 A
(106 mΩ Typical)
Test Conditions
VGS = 6 V
ID = 5 A
VDS = 400 V
Test Conditions
VDS = 400 V
VGS = 6 V
ID = 10 A
L = 318 µH
RG = 10 Ω
Test Conditions
RG = 10 Ω
VGS = 6 V
VDS = 400 V
L = 318 µH
ID = 10 A
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPG004-CDFG6517N-CM | WafflePack@60 | Please Call | 17A,650V Bare die,165.000 X 65.000 mils,MOSFET | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Package Detail Document:WAFER | Package Detail Document |
| Product Brief:PB GANFETS | Product Brief |