Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IT = 1 mA
(7.1 V Typical)
Test Conditions
IF = 10 mA
Test Conditions
f = 1 MHz
(9.5 pF Typical)
Test Conditions
VR = 3.3 V
f = 1 MHz
Test Conditions
IPP = 2 A
Test Conditions
VR = 5 V
(5 nA Typical)
Test Conditions
IPP = 4.3 A
Test Conditions
IPP = 9.8 A
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPZ39R-TVS5V0-CT200 | WafflePack@200 | Special Order Item | Bare die,11.000 X 11.000 mils,Quad Array TVS | EAR99 | 8541.10.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CPZ39R-CMNTVS5V0_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development