Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
ITM = 1.2 A
Test Conditions
VD = 7 V
RGK = 1 kΩ
RL = 100 Ω
Test Conditions
VD = 7 V
RGK = 1 kΩ
RL = 100 Ω
TC = -65 °C
Test Conditions
VD = 7 V
RL = 100 Ω
Test Conditions
VD = 7 V
RL = 100 Ω
TC = -65 °C
Test Conditions
VD = 7 V
RL = 100 Ω
TC = 125 °C
Test Conditions
RGK = 1 kΩ
Test Conditions
RGK = 1 kΩ
TC = -65 °C
Test Conditions
VDRM = 30 V
RGK = 1 kΩ
Test Conditions
VDRM = 30 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VD = 20 V
RGK = 1 kΩ
TC = 125 °C
Test Conditions
VRRM = 30 V
RGK = 1 kΩ
Test Conditions
VRRM = 30 V
RGK = 1 kΩ
TC = 125 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPS053-2N5060-CT | WafflePack@400 | Active | .8A,30V Bare die,53.150 X 53.150 mils,SCR | EAR99 | 8541.30.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CPS053.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |