Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VD = 200 V
IG = 1 mA
IF = 1 A
di/dt = 6 A/µs
Test Conditions
ITM = 1.2 A
TA = 25 °C
Test Conditions
VD = 200 V
RL = 100 Ω
TC = 110 °C
Test Conditions
VD = 7 V
RL = 100 Ω
Test Conditions
VD = 7 V
RL = 100 Ω
TC = -40 °C
Test Conditions
VD = 7 V
RL = 100 Ω
Test Conditions
VD = 7 V
RL = 100 Ω
TC = -40 °C
Test Conditions
IT = 20 mA
RGK = 1 kΩ
Test Conditions
IT = 20 mA
RGK = 1 kΩ
TC = -40 °C
Test Conditions
VDRM = 200 V
RGK = 1 kΩ
Test Conditions
VDRM = 200 V
RGK = 1 kΩ
TC = 110 °C
Test Conditions
VD = 200 V
RGK = 1 kΩ
Test Conditions
VD = 200 V
IG = 1 mA
IF = 1 A
di/dt = 6 A/µs
Test Conditions
IF = 1 A
tp = 50 µs
Duty Cycle = 0.1 %
di/dt = 6 A/µs
dv/dt = 20 V/µs
IG = 1 mA
Test Conditions
VRRM = 200 V
RGK = 1 kΩ
Test Conditions
VRRM = 200 V
RGK = 1 kΩ
TC = 110 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPS053-2N5064-CT | WafflePack@400 | Active | .8A,200V Bare die,53.150 X 53.150 mils,SCR | EAR99 | 8541.30.0040 | PBFREE | |
| CPS053-2N5064-WN | Wafer | Active | .8A,200V Bare die,53.150 X 53.150 mils,SCR | EAR99 | 8541.30.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CPS053.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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