Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
VD = 200 V
IG = 1 mA
IF = 1 A
di/dt = 6 A/µs
Test Conditions
ITM = 1.2 A
TA = 25 °C
Test Conditions
VD = 200 V
RL = 100 Ω
TC = 110 °C
Test Conditions
VD = 7 V
RL = 100 Ω
Test Conditions
VD = 7 V
RL = 100 Ω
TC = -40 °C
Test Conditions
VD = 7 V
RL = 100 Ω
Test Conditions
VD = 7 V
RL = 100 Ω
TC = -40 °C
Test Conditions
IT = 20 mA
RGK = 1 kΩ
Test Conditions
IT = 20 mA
RGK = 1 kΩ
TC = -40 °C
Test Conditions
VDRM = 200 V
RGK = 1 kΩ
Test Conditions
VDRM = 200 V
RGK = 1 kΩ
TC = 110 °C
Test Conditions
VD = 200 V
RGK = 1 kΩ
Test Conditions
VD = 200 V
IG = 1 mA
IF = 1 A
di/dt = 6 A/µs
Test Conditions
IF = 1 A
tp = 50 µs
Duty Cycle = 0.1 %
di/dt = 6 A/µs
dv/dt = 20 V/µs
IG = 1 mA
Test Conditions
VRRM = 200 V
RGK = 1 kΩ
Test Conditions
VRRM = 200 V
RGK = 1 kΩ
TC = 110 °C
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CPS053-2N5064-CT | WafflePack@400 | Active | .8A,200V Bare die,53.150 X 53.150 mils,SCR | EAR99 | 8541.30.0040 | PBFREE |
Resources
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|---|---|
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| CPS053.PDF | Device Datasheet |
| Material Composition:TO-92 | Material Composition |
| Package Detail Document:TO-92 | Package Detail Document |
| Product Reliability Data:TO-92 Package Reliability | Product Reliability Data |