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CPS053-CS92D

.8A,400V Bare die,53.150 X 53.150 mils,SCR

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Average Gate Power (PG(AV))
0.1 W
Forward Voltage (VTM)
1.7 V
Gate Trigger Current (IGT)
200 µA
Gate Trigger Voltage (VGT)
0.8 V
Holding Current (IH)
5 mA
Junction Temperature (Tj)
-40 — 125 °C
Peak Forward Gate Current (IFGM)
1 A
Peak Gate Power (PGM)
2 W
Peak Gate Voltage (VGM)
8 V
Peak Off-State Blocking Current (IDRM)
1 µA
Peak Off-State Blocking Current (IDRM)
100 µA
Peak One Cycle Surge Current (ITSM)
10 A
Peak Repetitive Off-State Voltage (VDRM)
400 V
Peak Repetitive Reverse Voltage (VRRM)
400 V
Rate of Rise of Reverse Voltage (dv/dt)
25 V/µs
RMS On-State Current (IT(RMS))
0.8 A
Storage Temperature (Tstg)
-40 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
200 °C/W
Thermal Resistance Junction-Case (ΘJC)
100 °C/W
ueak Reverse Blocking Current (IRRM)
1 µA
ueak Reverse Blocking Current (IRRM)
100 µA
Value For Fusing (I²T)
0.24 A2s

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CPS053-CS92D-CM WafflePack@400 Active .8A,400V Bare die,53.150 X 53.150 mils,SCR EAR99 8541.30.0040 PBFREE
CPS053-CS92D-CT WafflePack@400 Active .8A,400V Bare die,53.150 X 53.150 mils,SCR EAR99 8541.30.0040 PBFREE
CPS053-CS92D-CT20 WafflePack@20 Special Order Item .8A,400V Bare die,53.150 X 53.150 mils,SCR EAR99 8541.30.0040 PBFREE
CPS053-CS92D-WN Wafer Active .8A,400V Bare die,53.150 X 53.150 mils,SCR EAR99 8541.30.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CPS053-CS92D_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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