Home / Products / Die Solutions / Transistors / Darlington Transistors / CP101-BSS52

CP101-BSS52

1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Back to Top Specifications Ordering Resources Support

Technical Specifications

Similar Products with Selected Specifications
Base-Emitter On Voltage (VBE(ON))
1.3 — 1.65 V
Base-Emitter On Voltage (VBE(ON))
1.4 — 1.75 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.9 V
Base-Emitter Saturation Voltage (VBE(SAT))
2.2 V
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Voltage (VCBO)
90 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1.3 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1.3 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1.6 V
Collector-Emitter Saturation Voltage (VCE(SAT))
1.6 V
Collector-Emitter Voltage (VCER)
80 V
Continuous Collector Current (IC)
1 A
DC Current Gain (hFE)
1000
DC Current Gain (hFE)
2000
Emitter-Base Cutoff Current (IEBO)
50 nA
Emitter-Base Voltage (VEBO)
5 V
Junction Temperature (Tj)
-65 — 200 °C
Peak Base Current (IBM)
100 mA
Peak Collector Current (ICM)
2 A
Power Dissipation (PD)
800 mW
Power Dissipation (PD)
5 W
Small Signal Current Gain (hfe)
10
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
219 °C/W
Thermal Resistance Junction-Case (ΘJC)
35 °C/W
Turn Off Time (toff)
1.5 µs
Turn Off Time (toff)
1.5 µs
Turn On Time (ton)
400 ns
Turn On Time (ton)
400 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP101-BSS52-CT WafflePack@400 Discontinued 1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE
CP101-BSS52-CT20 WafflePack@20 Discontinued 1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE
CP101-BSS52-WN Wafer Discontinued 1A Bare die,27.500 X 27.500 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP101-BSS52_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Product EOL Notice:CP101 wafer process Product EOL Notice

Product Support

Contact Product Support

AEM stands ready to assist with your latest design endeavors as your trusted partner.

  • Supply management (Customer portals)
  • Inventory bonding
  • Consolidated shipping options
  • Custom bar coding for shipments
  • Custom product packing

Design Support

Contact Design Support

AEM stands ready to assist with your latest design endeavors as your trusted partner.

  • Free quick ship samples (2nd day air)
  • Online technical data and parametric search
  • SPICE models
  • Custom electrical curves
  • Environmental regulation compliance
  • Customer specific screening
  • Up-screening capabilities
  • Special wafer diffusions
  • PbSn plating options
  • Package details
  • Application notes
  • Application and design sample kits
  • Custom product and package development