CP327V-CMLT6427E
500mA,40V Bare die,22.835 X 22.835 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 50 mA
VCE = 5 V
Test Conditions
IC = 500 mA
IB = 500 µA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 30 V
Test Conditions
IC = 100 µA
Test Conditions
IC = 10 mA
Test Conditions
VCE = 25 V
Test Conditions
IC = 50 mA
IB = 500 µA
Test Conditions
IC = 100 mA
IB = 100 µA
Test Conditions
IC = 500 mA
IB = 500 µA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 5 V
IC = 10 mA
Test Conditions
VCE = 5 V
IC = 100 mA
Test Conditions
VCE = 5 V
IC = 500 mA
Test Conditions
IE = 10 µA
Test Conditions
VEB = 10 V
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCE = 5 V
IC = 1 mA
RS = 100 kΩ
f = 15.7 kHz
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP327V-CMLT6427E-CT | WafflePack@400 | Active | 500mA,40V Bare die,22.835 X 22.835 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP327V-CMLT6427E_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |