CP219-2N5339
100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 2 A
IB = 200 mA
Test Conditions
IC = 5 A
IB = 500 mA
Test Conditions
VCB = 100 V
Test Conditions
IC = 50 mA
Test Conditions
VCE = 90 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 90 V
VBE(OFF) = 1.5 V
TC = 150 °C
Test Conditions
VCE = 90 V
Test Conditions
IC = 2 A
IB = 200 mA
Test Conditions
IC = 5 A
IB = 500 mA
Test Conditions
VCE = 10 V
IC = 500 mA
f = 10 MHz
Test Conditions
VCE = 2 V
IC = 500 mA
Test Conditions
VCE = 2 V
IC = 2 A
Test Conditions
VCE = 2 V
IC = 5 A
Test Conditions
VEB = 6 V
Test Conditions
VCC = 40 V
IC = 2 A
IB1 = 200 mA
IB2 = 200 mA
Test Conditions
VEB = 2 V
Test Conditions
VEB = 2 V
f = 100 kHz
Test Conditions
VCB = 10 V
f = 100 kHz
Test Conditions
VCC = 40 V
IC = 2 A
IB1 = 200 mA
IB2 = 200 mA
Test Conditions
VCC = 40 V
IC = 2 A
IB1 = 200 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP219-2N5339-CM | WafflePack@100 | Discontinued | 100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP219-2N5339-CT | WafflePack@100 | Discontinued | 100V,5A,6W Bare die,82.690 X 82.690 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP219-2N5339_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CP219 DIE PROCESS | Product EOL Notice |