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CP235-2N3055
60V,15A,115W Bare die,105.900 X 105.900 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 4 A
VCE = 4 V
Test Conditions
IC = 200 mA
Test Conditions
IC = 200 mA
RBE = 100 Ω
Test Conditions
VCE = 100 V
VBE(OFF) = 1.5 V
Test Conditions
VCE = 100 V
VBE(OFF) = 1.5 V
TC = 150 °C
Test Conditions
VCE = 30 V
Test Conditions
IC = 4 A
IB = 400 mA
Test Conditions
IC = 10 A
IB = 3.3 A
Test Conditions
VCE = 10 V
IC = 500 mA
f = 1 MHz
Test Conditions
VCE = 4 V
IC = 4 A
Test Conditions
VCE = 4 V
IC = 10 A
Test Conditions
VEB = 7 V
Test Conditions
VCE = 40 V
tp = 1 s
Test Conditions
VCE = 4 V
IC = 1 A
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP235-2N3055-CT | WafflePack@100 | Discontinued | 60V,15A,115W Bare die,105.900 X 105.900 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP235-2N3055_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:CPP55-BC177 | Product EOL Notice |