CP243-CM5943
30V,400mA,1W Bare die,21.650 X 21.650 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
f = 200 MHz
IC = 10 mA
VCE = 15 V
Test Conditions
f = 250 MHz
IC = 50 mA
VCE = 15 V
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 15 V
Test Conditions
VCB = 15 V
f = 31.8 MHz
IE = 50 mA
Test Conditions
IC = 5 mA
Test Conditions
VCE = 20 V
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
VCE = 15 V
IC = 25 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 50 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 100 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 50 mA
Test Conditions
IE = 100 µA
Test Conditions
VEB = 500 mV
f = 100 kHz
Test Conditions
VCE = 15 V
IC = 30 mA
f = 200 MHz
Test Conditions
VCE = 15 V
IC = 35 mA
f = 200 MHz
Test Conditions
VCB = 30 V
f = 100 kHz
Test Conditions
VCE = 15 V
IC = 50 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP243-CM5943-CM | WafflePack@400 | Discontinued, Stock Only | 30V,400mA,1W Bare die,21.650 X 21.650 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP243-CM5943-CT20 | WafflePack@20 | Discontinued, Stock Only | 30V,400mA,1W Bare die,21.650 X 21.650 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP243-CM5943-WN | Wafer | Discontinued | 30V,400mA,1W Bare die,21.650 X 21.650 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP243-CM5943_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Product EOL Notice:RF TRANSISTOR DIE | Product EOL Notice |
| Spice Model:Spice Model CP243 | Spice Model |
Product Support
Contact Product SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Supply management (Customer portals)
- Inventory bonding
- Consolidated shipping options
- Custom bar coding for shipments
- Custom product packing
Design Support
Contact Design SupportAEM stands ready to assist with your latest design endeavors as your trusted partner.
- Free quick ship samples (2nd day air)
- Online technical data and parametric search
- SPICE models
- Custom electrical curves
- Environmental regulation compliance
- Customer specific screening
- Up-screening capabilities
- Special wafer diffusions
- PbSn plating options
- Package details
- Application notes
- Application and design sample kits
- Custom product and package development