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CP305V-BC817
45V,500mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 500 mA
VCE = 1 V
Test Conditions
VCB = 20 V
Test Conditions
VCB = 20 V
TJ = 150 °C
Test Conditions
IC = 10 µA
Test Conditions
IC = 10 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 5 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
VCE = 1 V
IC = 500 mA
Test Conditions
IE = 1 µA
Test Conditions
VEB = 5 V
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP305V-BC817-CM | WafflePack@400 | Active | 45V,500mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP305V-BC817-CT | WafflePack@400 | Active | 45V,500mA,350mW Bare die,31.100 X 31.100 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP305V-BC817_WPD.pdf | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |