CP306V-2N3019
80V,1A,800mW Bare die,27.560 X 27.560 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 90 V
Test Conditions
VCB = 90 V
TA = 150 °C
Test Conditions
VCB = 10 V
f = 4 MHz
IC = 10 mA
Test Conditions
IC = 30 mA
Test Conditions
IC = 150 mA
IB = 15 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 10 V
IC = 50 mA
f = 20 MHz
Test Conditions
VCE = 10 V
IC = 100 µA
Test Conditions
VCE = 10 V
IC = 10 mA
Test Conditions
VCE = 10 V
IC = 150 mA
Test Conditions
VCE = 10 V
IC = 150 mA
TA = -55 °C
Test Conditions
VCE = 10 V
IC = 500 mA
Test Conditions
VCE = 10 V
IC = 1 A
Test Conditions
IE = 100 µA
Test Conditions
VEB = 5 V
Test Conditions
VEB = 0.5 V
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 100 µA
f = 1 kHz
RS = 1 kΩ
Test Conditions
VCB = 10 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP306V-2N3019-CM | WafflePack@400 | Active | 80V,1A,800mW Bare die,27.560 X 27.560 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP306V-2N3019-CT | WafflePack@400 | Active | 80V,1A,800mW Bare die,27.560 X 27.560 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP306V-2N3019-CT20 | WafflePack@20 | Special Order Item | 80V,1A,800mW Bare die,27.560 X 27.560 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP306V-2N3019_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |