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CP317X-2N918

15V,50mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Device Datasheet

Technical Specifications

Amplifier Power Gain (G_pe)

15 dB

Base-Emitter Saturation Voltage (V_BE(SAT))

1 V

Collector Efficiency (η)

25 %

Collector-Base Breakdown Voltage (BV_CBO)

30 V

Collector-Base Cutoff Current (I_CBO)

10 nA

Collector-Base Cutoff Current (I_CBO)

1 µA

Collector-Base Voltage (V_CBO)

30 V

Collector-Emitter Breakdown Voltage (BV_CEO)

15 V

Collector-Emitter Saturation Voltage (V_CE(SAT))

400 mV

Collector-Emitter Voltage (V_CEO)

15 V

Continuous Collector Current (I_C)

50 mA

Current Gain-Bandwidth Product (f_T)

600 MHz

DC Current Gain (h_FE)

Emitter-Base Breakdown Voltage (BV_EBO)

3 V

Emitter-Base Voltage (V_EBO)

3 V

Input Capacitance (C_ib)

2 pF

Junction Temperature (T_j)

-65 — 200 °C

Noise Figure (NF)

6 dB

Output Capacitance (C_ob)

1.7 pF

Output Capacitance (C_ob)

3 pF

Power Dissipation (P_D)

200 mW

Power Dissipation (P_D)

300 mW

Power Output (P_out)

30 mW

Storage Temperature (T_stg)

-65 — 200 °C

Thermal Resistance Junction-Ambient (Θ_JA)

875 °C/W

Thermal Resistance Junction-Case (Θ_JC)

583 °C/W

Ordering

Part	Package	Status	Description	ECCN Code	HTS Code	Termination
CP317X-2N918-CM	WafflePack@400	Active	15V,50mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A)	EAR99	8541.21.0040	PBFREE
CP317X-2N918-CT	WafflePack@400	Active	15V,50mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A)	EAR99	8541.21.0040	PBFREE
CP317X-2N918-CT20	WafflePack@20	Special Order Item	15V,50mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A)	EAR99	8541.21.0040	PBFREE

Resources


Item	Type
No matching documents found.
Analytical Test Report:Active Device, Rectifier	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Die	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Schottky	Analytical Test Report
Analytical Test Report:Wafer Switching Diode	Analytical Test Report
Analytical Test Report:Wafer Transistor	Analytical Test Report
Analytical Test Report:Wafer Zener	Analytical Test Report
Analytical Test Report:Wafer/Die	Analytical Test Report
CP317X-2N918_WPD.PDF	Device Datasheet
Package Detail Document:WAFER	Package Detail Document