CP317X-BFY90
15V,25mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
f = 200 MHz
IC = 14 mA
VCE = 10 V
(23 dB Typical)
Test Conditions
f = 800 MHz
IC = 14 mA
VCE = 10 V
Test Conditions
IC = 10 µA
Test Conditions
VCB = 15 V
Test Conditions
IC = 1 mA
RBE = 50 Ω
Test Conditions
IC = 1 mA
Test Conditions
VCE = 5 V
IC = 2 mA
f = 500 MHz
(1100 MHz Typical)
Test Conditions
VCE = 5 V
IC = 25 mA
f = 500 MHz
(1400 MHz Typical)
Test Conditions
VCE = 1 V
IC = 2 mA
Test Conditions
VCE = 1 V
IC = 25 mA
Test Conditions
IE = 10 µA
Test Conditions
VCE = 5 V
IC = 2 mA
f = 200 MHz
(2.5 dB Typical)
Test Conditions
VCE = 5 V
IC = 2 mA
f = 500 MHz
RG = 50 Ω
Test Conditions
VCE = 5 V
IC = 2 mA
f = 800 MHz
Test Conditions
VCE = 5 V
IC = 2 mA
f = 100 kHz
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
IC = 14 mA
f = 205 MHz
VCE = 10 V
(12 mW Typical)
Test Conditions
VCE = 5 V
IC = 2 mA
f = 1 MHz
(0.6 pF Typical)
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP317X-BFY90-CT | WafflePack@400 | Active | 15V,25mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP317X-BFY90-CT20 | WafflePack@20 | Active | 15V,25mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP317X-BFY90-WN | Wafer | Active | 15V,25mA,200mW Bare die,14.565 X 14.565 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP317X-BFY90_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
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