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CP318V-2N3501

150V,300mA,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
800 mV
Base-Emitter Saturation Voltage (VBE(SAT))
900 mV
Base-Emitter Saturation Voltage (VBE(SAT))
1.2 V
Collector-Base Breakdown Voltage (BVCBO)
150 V
Collector-Base Cutoff Current (ICBO)
50 nA
Collector-Base Cutoff Current (ICBO)
50 µA
Collector-Base Voltage (VCBO)
150 V
Collector-Emitter Breakdown Voltage (BVCEO)
150 V
Collector-Emitter Saturation Voltage (VCE(SAT))
200 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
250 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
400 mV
Collector-Emitter Voltage (VCEO)
150 V
Continuous Collector Current (IC)
300 mA
Current Gain-Bandwidth Product (fT)
150 MHz
DC Current Gain (hFE)
35
DC Current Gain (hFE)
50
DC Current Gain (hFE)
75
DC Current Gain (hFE)
100 — 300
DC Current Gain (hFE)
20
Delay Time (td)
20 ns
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Cutoff Current (IEBO)
25 nA
Emitter-Base Voltage (VEBO)
6 V
Fall Time (tf)
80 ns
Input Capacitance (Cib)
80 pF
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
8 pF
Power Dissipation (PD)
1 W
Power Dissipation (PD)
5 W
Rise Time (tr)
35 ns
Storage Temperature (Tstg)
-65 — 200 °C
Storage Time (ts)
800 ns
Thermal Resistance Junction-Ambient (ΘJA)
175 °C/W
Thermal Resistance Junction-Case (ΘJC)
35 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP318V-2N3501-CM WafflePack@400 Active 150V,300mA,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP318V-2N3501-CT WafflePack@400 Active 150V,300mA,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP318V-2N3501-WN Wafer Active 150V,300mA,1W Bare die,25.984 X 25.984 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP318V-2N3501_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Spice Model:Spice Model CP318V Spice Model

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