CP319-CZTA44HC
400V,2A,2W Bare die,87.000 X 87.000 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 1 A
IB = 100 mA
Test Conditions
IC = 50 µA
Test Conditions
VCB = 400 V
Test Conditions
IC = 1 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 1 A
IB = 100 mA
Test Conditions
IC = 2 A
IB = 200 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 10 MHz
Test Conditions
VCE = 10 V
IC = 10 mA
Test Conditions
VCE = 10 V
IC = 500 mA
Test Conditions
VCE = 10 V
IC = 1 A
Test Conditions
VCE = 10 V
IC = 2 A
Test Conditions
IE = 50 µA
Test Conditions
VEB = 5 V
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCB = 20 V
f = 1 MHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP319-CZTA44HC-CT | WafflePack@100 | Discontinued | 400V,2A,2W Bare die,87.000 X 87.000 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP319.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP319 replaced by CP212 | Process Change Notice |
| Product EOL Notice:BLANKET PDN-BARE DIE PRODUCTS | Product EOL Notice |
| Spice Model:Spice Model CP319 | Spice Model |
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