CP348-BUY48

170V,7A,1W Bare die,82.677 X 82.677 mils,Transistor-Bipolar Power (>1A)

Case Type: CHIP,WAFFLE

Base-Emitter Saturation Voltage (VBE(SAT))
1.1 V
Base-Emitter Saturation Voltage (VBE(SAT))
1.5 V
Collector-Base Breakdown Voltage (BVCBO)
200 V
Collector-Base Cutoff Current (ICBO)
10 µA
Collector-Base Cutoff Current (ICBO)
1 mA
Collector-Base Voltage (VCBO)
200 V
Collector-Emitter Breakdown Voltage (BVCEO)
170 V
Collector-Emitter Saturation Voltage (VCE(SAT))
450 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Voltage (VCEO)
170 V
Continuous Collector Current (IC)
7 A
Current Gain-Bandwidth Product (fT)
90 MHz
DC Current Gain (hFE)
40
DC Current Gain (hFE)
40
DC Current Gain (hFE)
15
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Voltage (VEBO)
6 V
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
80 pF
Peak Collector Current (ICM)
10 A
Power Dissipation (PD)
1 W
Power Dissipation (PD)
10 W
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
175 °C/W
Thermal Resistance Junction-Case (ΘJC)
15 °C/W
Turn Off Time (toff)
2 µs
Turn On Time (ton)
1 µs

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP348-BUY48-CT WafflePack@100 Active 170V,7A,1W Bare die,82.677 X 82.677 mils,Transistor-Bipolar Power (>1A) EAR99 8541.29.0040 PBFREE
CP348-BUY48-WN Wafer Active 170V,7A,1W Bare die,82.677 X 82.677 mils,Transistor-Bipolar Power (>1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP348-BUY48_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Spice Model:Spice Model CP348 Spice Model

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