CP349-BUY49S
200V,3A,1W Bare die,51.181 X 51.181 mils,Transistor-Bipolar Power (>1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
IC = 100 µA
Test Conditions
VCB = 200 V
Test Conditions
VCB = 200 V
TC = 150 °C
Test Conditions
IC = 20 mA
Test Conditions
IC = 500 mA
IB = 50 mA
Test Conditions
VCE = 10 V
IC = 100 mA
Test Conditions
VCE = 5 V
IC = 20 mA
Test Conditions
VCE = 5 V
IC = 500 mA
Test Conditions
VCE = 2 V
IC = 20 mA
TC = -55 °C
Test Conditions
IE = 1 mA
Test Conditions
VCB = 10 V
f = 1 MHz
Test Conditions
VCE = 50 V
tp = 1 s
Test Conditions
VCC = 20 V
IC = 500 mA
IB1 = 50 mA
IB2 = 50 mA
Test Conditions
VCC = 20 V
IC = 500 mA
IB1 = 50 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP349-BUY49S-CT | WafflePack@400 | Active | 200V,3A,1W Bare die,51.181 X 51.181 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE | |
| CP349-BUY49S-CT20 | WafflePack@20 | Special Order Item | 200V,3A,1W Bare die,51.181 X 51.181 mils,Transistor-Bipolar Power (>1A) | EAR99 | 8541.29.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| CP349-BUY49S_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Spice Model:Spice Model CP349 | Spice Model |