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CP388X-BC847B

45V,100mA,330mW Bare die,12.990 X 12.990 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Base-Emitter On Voltage (VBE(ON))
580 — 700 mV
Base-Emitter On Voltage (VBE(ON))
770 mV
Base-Emitter Saturation Voltage (VBE(SAT))
700 mV
Base-Emitter Saturation Voltage (VBE(SAT))
900 mV
Collector-Base Breakdown Voltage (BVCBO)
50 V
Collector-Base Capacitance (Ccb)
4.5 pF
Collector-Base Cutoff Current (ICBO)
15 nA
Collector-Base Cutoff Current (ICBO)
5 µA
Collector-Base Voltage (VCBO)
50 V
Collector-Emitter Breakdown Voltage (BVCEO)
45 V
Collector-Emitter Saturation Voltage (VCE(SAT))
250 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
600 mV
Collector-Emitter Voltage (VCEO)
45 V
Continuous Collector Current (IC)
100 mA
DC Current Gain (hFE)
200 — 450
Emitter-Base Breakdown Voltage (BVEBO)
6 V
Emitter-Base Cutoff Current (IEBO)
100 nA
Emitter-Base Voltage (VEBO)
6 V
Junction Temperature (Tj)
-55 — 150 °C
Peak Base Current (IBM)
200 mA
Peak Collector Current (ICM)
200 mA
Power Dissipation (PD)
330 mW
Storage Temperature (Tstg)
-55 — 150 °C
Thermal Resistance Junction-Ambient (ΘJA)
375 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP388X-BC847B-CT WafflePack@400 Active 45V,100mA,330mW Bare die,12.990 X 12.990 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE
CP388X-BC847B-WN Wafer Active 45V,100mA,330mW Bare die,12.990 X 12.990 mils,Transistor-Small Signal (<=1A) EAR99 8541.21.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP388X.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document

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