CP392V-CMLT3904E
40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A)
Case Type: WAFER
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
(750 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(850 mV Typical)
Test Conditions
IC = 10 µA
(115 V Typical)
Test Conditions
IC = 1 mA
(60 V Typical)
Test Conditions
VCE = 30 V
VBE(OFF) = 3 V
Test Conditions
IC = 10 mA
IB = 1 mA
(57 mV Typical)
Test Conditions
IC = 50 mA
IB = 5 mA
(100 mV Typical)
Test Conditions
VCE = 20 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 0.1 mA
(240 Typical)
Test Conditions
VCE = 1 V
IC = 1 mA
(235 Typical)
Test Conditions
VCE = 1 V
IC = 10 mA
(215 Typical)
Test Conditions
VCE = 1 V
IC = 50 mA
(110 Typical)
Test Conditions
VCE = 1 V
IC = 100 mA
(50 Typical)
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
IE = 10 µA
(7.5 V Typical)
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VEB = 500 mV
f = 1 MHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCE = 5 V
IC = 100 µA
RS = 1 kΩ
f = 15.7 kHz
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCB = 5 V
f = 1 MHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
VBE = 500 mV
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 1 mA
IB2 = 1 mA
Test Conditions
VCE = 10 V
IC = 1 mA
f = 1 kHz
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP392V-CMLT3904E-WN | Wafer | Active | 40V,200mA,350mW Bare die,11.024 X 11.024 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Copper Bond Wire | Analytical Test Report |
| Analytical Test Report:Gold Bond Wire | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Green Epoxy Molding Compound | Analytical Test Report |
| Analytical Test Report:Henkel 84-1LMISR4 | Analytical Test Report |
| Analytical Test Report:Leadframe | Analytical Test Report |
| Analytical Test Report:Sn Plating | Analytical Test Report |
| CP392V-CMLT3904E_WPD.PDF | Device Datasheet |
| Material Composition:SOT-23 | Material Composition |
| Package Detail Document:SOT-23 | Package Detail Document |
| Product Reliability Data:SOT-23 Package Reliability | Product Reliability Data |
| Step File 3D Object:SOT-23 | Step File 3D Object |
Product Support
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Design Support
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