CP396V-2N2369A
15V,200mA,360mW Bare die,14.200 X 8.700 mils,Transistor-Small Signal (<=1A)
Case Type: CHIP,WAFFLE
Technical Specifications
Similar Products with Selected SpecificationsTest Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 30 mA
IB = 3 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
IC = 10 µA
Test Conditions
VCB = 20 V
Test Conditions
VCB = 20 V
TA = 150 °C
Test Conditions
IC = 10 µA
Test Conditions
IC = 10 mA
Test Conditions
IC = 10 mA
IB = 1 mA
Test Conditions
IC = 10 mA
IB = 1 mA
TA = 125 °C
Test Conditions
IC = 30 mA
IB = 3 mA
Test Conditions
IC = 100 mA
IB = 10 mA
Test Conditions
VCE = 10 V
IC = 10 mA
f = 100 MHz
Test Conditions
VCE = 1 V
IC = 10 mA
Test Conditions
VCE = 0.35 V
IC = 10 mA
TA = -55 °C
Test Conditions
VCE = 0.4 V
IC = 30 mA
Test Conditions
VCE = 1 V
IC = 100 mA
Test Conditions
IE = 10 µA
Test Conditions
VCB = 5 V
f = 140 kHz
Test Conditions
VCC = 10 V
IC = 10 mA
IB1 = 10 mA
IB2 = 10 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 3 mA
IB2 = 1.5 mA
Test Conditions
VCC = 3 V
IC = 10 mA
IB1 = 3 mA
Ordering
| Part | Package | Buy | Status | Description | ECCN Code | HTS Code | Termination |
|---|---|---|---|---|---|---|---|
| CP396V-2N2369A-CM | WafflePack@400 | Active | 15V,200mA,360mW Bare die,14.200 X 8.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP396V-2N2369A-CT | WafflePack@400 | Active | 15V,200mA,360mW Bare die,14.200 X 8.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP396V-2N2369A-CT20 | WafflePack@20 | Special Order Item | 15V,200mA,360mW Bare die,14.200 X 8.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE | |
| CP396V-2N2369A-WN | Wafer | Active | 15V,200mA,360mW Bare die,14.200 X 8.700 mils,Transistor-Small Signal (<=1A) | EAR99 | 8541.21.0040 | PBFREE |
Resources
| Item | Type |
|---|---|
| No matching documents found. | |
| Analytical Test Report:Active Device, Rectifier | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:Die | Analytical Test Report |
| Analytical Test Report:TVS Die | Analytical Test Report |
| Analytical Test Report:Wafer Rectifier | Analytical Test Report |
| Analytical Test Report:Wafer Schottky | Analytical Test Report |
| Analytical Test Report:Wafer Switching Diode | Analytical Test Report |
| Analytical Test Report:Wafer Transistor | Analytical Test Report |
| Analytical Test Report:Wafer Zener | Analytical Test Report |
| Analytical Test Report:Wafer/Die | Analytical Test Report |
| CP396V-2N2369A_WPD.PDF | Device Datasheet |
| Package Detail Document:WAFER | Package Detail Document |
| Process Change Notice:CP207 replaced by CP396V | Process Change Notice |
| Product EOL Notice:BLANKET PDN-BARE DIE PRODUCTS | Product EOL Notice |
| Spice Model:Spice Model CP207 | Spice Model |
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