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CP591X-2N2905A

60V,600mA,600mW Bare die,19.290 X 19.290 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

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Technical Specifications

Similar Products with Selected Specifications
Base-Emitter Saturation Voltage (VBE(SAT))
1.3 V
Base-Emitter Saturation Voltage (VBE(SAT))
2.6 V
Collector-Base Breakdown Voltage (BVCBO)
60 V
Collector-Base Cutoff Current (ICBO)
10 nA
Collector-Base Voltage (VCBO)
60 V
Collector-Emitter Breakdown Voltage (BVCEO)
60 V
Collector-Emitter Cutoff Current (ICEV)
50 nA
Collector-Emitter Saturation Voltage (VCE(SAT))
400 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1.6 V
Collector-Emitter Voltage (VCEO)
60 V
Continuous Collector Current (IC)
600 mA
Current Gain-Bandwidth Product (fT)
200 MHz
DC Current Gain (hFE)
75
DC Current Gain (hFE)
100
DC Current Gain (hFE)
100
DC Current Gain (hFE)
100 — 300
DC Current Gain (hFE)
50
Emitter-Base Breakdown Voltage (BVEBO)
5 V
Emitter-Base Voltage (VEBO)
5 V
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
8 pF
Power Dissipation (PD)
600 mW
Power Dissipation (PD)
3 W
Storage Temperature (Tstg)
-65 — 200 °C
Turn Off Time (toff)
180 ns
Turn On Time (ton)
45 ns

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP591X-2N2905A-CM WafflePack@400 Active 60V,600mA,600mW Bare die,19.290 X 19.290 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP591X-2N2905A-CT WafflePack@400 Active 60V,600mA,600mW Bare die,19.290 X 19.290 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Item Type
Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP591X-2N2905A_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Process Change Notice:CP191V / CP591X Wafers Process Change Notice