CP595-2N5680

120V,1A,1W Bare die,32.000 X 32.000 mils,Transistor-Small Signal (<=1A)

Case Type: CHIP,WAFFLE

Base-Emitter On Voltage (VBE(ON))
1 V
Collector-Base Cutoff Current (ICBO)
1 µA
Collector-Base Voltage (VCBO)
120 V
Collector-Emitter Breakdown Voltage (BVCEO)
120 V
Collector-Emitter Cutoff Current (ICEV)
1 µA
Collector-Emitter Cutoff Current (ICEV)
1 mA
Collector-Emitter Cutoff Current (ICEO)
10 µA
Collector-Emitter Saturation Voltage (VCE(SAT))
600 mV
Collector-Emitter Saturation Voltage (VCE(SAT))
1 V
Collector-Emitter Saturation Voltage (VCE(SAT))
2 V
Collector-Emitter Voltage (VCEO)
120 V
Continuous Base Current (IB)
500 mA
Continuous Collector Current (IC)
1 A
Current Gain-Bandwidth Product (fT)
30 MHz
DC Current Gain (hFE)
40 — 150
DC Current Gain (hFE)
5
Emitter-Base Cutoff Current (IEBO)
1 µA
Emitter-Base Voltage (VEBO)
4 V
Junction Temperature (Tj)
-65 — 200 °C
Output Capacitance (Cob)
50 pF
Power Dissipation (PD)
1 W
Power Dissipation (PD)
10 W
Small Signal Current Gain (hfe)
40
Storage Temperature (Tstg)
-65 — 200 °C
Thermal Resistance Junction-Ambient (ΘJA)
175 °C/W
Thermal Resistance Junction-Case (ΘJC)
17.5 °C/W

Ordering

Part Package Buy Status Description ECCN Code HTS Code Termination
CP595-2N5680-CT WafflePack@400 Active 120V,1A,1W Bare die,32.000 X 32.000 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE
CP595-2N5680-WN Wafer Active 120V,1A,1W Bare die,32.000 X 32.000 mils,Transistor-Small Signal (<=1A) EAR99 8541.29.0040 PBFREE

Resources

Analytical Test Report:Active Device, Rectifier Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:Die Analytical Test Report
Analytical Test Report:TVS Die Analytical Test Report
Analytical Test Report:Wafer Rectifier Analytical Test Report
Analytical Test Report:Wafer Schottky Analytical Test Report
Analytical Test Report:Wafer Switching Diode Analytical Test Report
Analytical Test Report:Wafer Transistor Analytical Test Report
Analytical Test Report:Wafer Zener Analytical Test Report
Analytical Test Report:Wafer/Die Analytical Test Report
CP595-2N5680_WPD.PDF Device Datasheet
Package Detail Document:WAFER Package Detail Document
Spice Model:Spice Model CP595 Spice Model

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